发明名称 |
Methods for testing continuity of electrical paths through connectors of circuit assemblies |
摘要 |
In one embodiment, a method for testing continuity of electrical paths through a circuit assembly includes: 1) mating a test-facilitating circuit package to a connector of the circuit assembly; the circuit package having a plurality of contacts for mating to a plurality of contacts of the connector; the circuit package containing incomplete or no mission circuitry for the circuit assembly, but containing a plurality of passive circuit components coupled in parallel between the package's plurality of contacts and a test sensor port of the circuit package; 2) stimulating one or more nodes of the circuit assembly; 3) measuring an electrical characteristic of the circuit package; and 4) comparing the measured electrical characteristic to at least one threshold to assess continuities of at least two electrical paths through the circuit assembly. Other embodiments are also disclosed.
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申请公布号 |
US7170298(B2) |
申请公布日期 |
2007.01.30 |
申请号 |
US20050175783 |
申请日期 |
2005.07.05 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
PARKER KENNETH P.;BELL JACOB L. |
分类号 |
G01R31/04;G01R13/02;G01R13/28;G01R31/02;G01R31/26;G01R31/28;G01R31/312 |
主分类号 |
G01R31/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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