发明名称 Method for replacing defects in a memory and apparatus thereof
摘要 A method and an apparatus for restoring defective memory cells are provided. The apparatus includes memory, a memory scan controller, which scans the memory to see if the memory is defective when a system starts operating and transmits resulting defect information to a memory controller, and the memory controller, which converts an external address applied from a system controller into an internal address for accessing the memory and replaces a defective cell in the memory with spare memory provided therein so that when a request for access to the defective cell is issued by the system controller, spare memory, rather than the defective cell, can be accessed by the system controller.
申请公布号 US7170801(B2) 申请公布日期 2007.01.30
申请号 US20030612300 申请日期 2003.07.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SANG-SU;SEO YOUNG-JOO;PARK SE-WOONG;LEE YOON-NAM
分类号 G11C29/00;G06F13/00;G11C7/00;G11C7/24 主分类号 G11C29/00
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