发明名称 |
RESIST PATTERN, METHOD FOR MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a material or the like that can reduce the thickness of a resist pattern. SOLUTION: A resist pattern thinning material is provided which comprises at least one kind selected from water-soluble resins and alkali-soluble resins. A method for manufacturing a resist pattern includes a step of applying the resist pattern thinning material to cover the surface of a formed resist pattern to form a mixing layer with the resist pattern thinning material on the surface of the resist pattern. A method for manufacturing a semiconductor device includes a step of applying the resist pattern thinning material to cover the surface of a resist pattern formed on a base layer to form a mixing layer with the resist pattern thinning material on the surface of the resist pattern and developing to form a thinned resist pattern, and a step of patterning the base layer by etching using the resist pattern as a mask. COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007017993(A) |
申请公布日期 |
2007.01.25 |
申请号 |
JP20060225826 |
申请日期 |
2006.08.22 |
申请人 |
FUJITSU LTD |
发明人 |
OZAWA YOSHIKAZU;NOZAKI KOJI;NAMIKI TAKAHISA;KON JUNICHI |
分类号 |
G03F7/40;H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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