| 摘要 |
A Laser Scanning Microscope, preferably with line-shaped sampling, whereby illumination radiation from the Microscope is guided over a sample with at least one galvanometer scanner. The scanner has a mechanical deflection limit. A means for the determination of a current increase is provided in the scanner. On reaching a threshold value, the operating voltage of the scanner is switched off until it declines below the threshold value and preferably an optical and/or acoustic display device is provided, which displays the switching on and off of the scanner.
|
