发明名称 EXAMINATION PLANNING METHOD IN MAGNETIC RESONANCE APPARATUS, AND MAGNETIC RESONANCE APPARATUS FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To simplify and facilitate planning for examination in a magnetic resonance apparatus preferably including measurement at different positions in an examination stand. SOLUTION: The position of at least one first image in an examined object is determined, and the measurement parameter for the at least one first image is set. Then, the position of at least one second image in the examined object is determined, and the measurement parameter for the at least one second image is set. The measurement parameter as subordinate measurement parameter is determined, and the measurement parameter is adjusted by a plurality of images based on the subordinate measurement parameter so that the parameter is the same for all the images. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007014781(A) 申请公布日期 2007.01.25
申请号 JP20060187138 申请日期 2006.07.06
申请人 SIEMENS AG 发明人 MAIER CLAUS;MOHR CECILE;MUELLER MIKE
分类号 A61B5/055;G01R33/32 主分类号 A61B5/055
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