发明名称 Pre-aligning a substrate in a lithographic apparatus, device manufacturing method, and device manufactured by the manufacturing method
摘要 A method of pre-aligning a substrate in a lithographic apparatus is described. The substrate has at least one alignment mark provided on a side of the substrate. The method includes determining a relationship between a position of the at least one alignment mark, at least part of an edge of the substrate, and a center of the substrate. A substrate support is provided to support a substrate, the substrate support having at least one optical view window at a predetermined location to view a part of the side of the substrate. The substrate is placed on the substrate support on the basis of the relationship to position the at least one alignment mark in the at least one optical view window.
申请公布号 US2007019177(A1) 申请公布日期 2007.01.25
申请号 US20060482195 申请日期 2006.07.07
申请人 ASML NETHERLANDS B.V. 发明人 WILHELMUS MARIA VAN BUEL HENRICUS;BERGE PETER T.;WILHELMUS VAN DER HEIJDEN MARCUS T.
分类号 G03B27/52 主分类号 G03B27/52
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