<p>A method for forming a semiconductor device is provided to uniformly distribute impurity elements in a three-dimensional structure like a channel region or a source drain region by isotropically doping the three-dimensional structure by a plasma doping process using first source gas including n-type or p-type impurity element and second source gas including dilution elements unrelated to an electrical characteristic of a doping region. A three-dimensional structure of a semiconductor is formed on a semiconductor substrate. A plasma doping process is performed to isotropically dope the three-dimensional structure, using first source gas including n-type or p-type impurity element and second source gas including dilution elements unrelated to an electrical characteristic of a doping region(S170). The process for forming the three-dimensional structure includes a process for forming a pin protruding upward from the semiconductor substrate wherein the pin includes a channel region and is the three-dimensional structure.</p>
申请公布号
KR20070012069(A)
申请公布日期
2007.01.25
申请号
KR20050066891
申请日期
2005.07.22
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
BUH, GYOUNG HO;RYOO, CHANG WOO;SHIN, YU GYUN;PARK, TAI SU;LEE, JIN WOOK