发明名称 METHODS OF FORMING SEMICONDUCTOR DEVICE
摘要 <p>A method for forming a semiconductor device is provided to uniformly distribute impurity elements in a three-dimensional structure like a channel region or a source drain region by isotropically doping the three-dimensional structure by a plasma doping process using first source gas including n-type or p-type impurity element and second source gas including dilution elements unrelated to an electrical characteristic of a doping region. A three-dimensional structure of a semiconductor is formed on a semiconductor substrate. A plasma doping process is performed to isotropically dope the three-dimensional structure, using first source gas including n-type or p-type impurity element and second source gas including dilution elements unrelated to an electrical characteristic of a doping region(S170). The process for forming the three-dimensional structure includes a process for forming a pin protruding upward from the semiconductor substrate wherein the pin includes a channel region and is the three-dimensional structure.</p>
申请公布号 KR20070012069(A) 申请公布日期 2007.01.25
申请号 KR20050066891 申请日期 2005.07.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BUH, GYOUNG HO;RYOO, CHANG WOO;SHIN, YU GYUN;PARK, TAI SU;LEE, JIN WOOK
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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