发明名称 Semiconductor device and short circuit detecting method
摘要 A short circuit detection region includes an insulating film, plural first conductor traces and plural second conductor traces which are embedded in the insulating film with only their surfaces being exposed, and the first conductor trace is constructed by integrally forming a band-shaped portion and plural via portions which are electrically connected to a silicon semiconductor substrate.
申请公布号 US2007019456(A1) 申请公布日期 2007.01.25
申请号 US20050259141 申请日期 2005.10.27
申请人 FUJITSU LIMITED 发明人 SHIMADA AKIHIRO
分类号 G11C5/06 主分类号 G11C5/06
代理机构 代理人
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