发明名称 Method of analysis of samples by determination of a function of specific brightness
摘要 A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function of the number of photon counts.
申请公布号 US2007020645(A1) 申请公布日期 2007.01.25
申请号 US20060341859 申请日期 2006.01.30
申请人 EVOTEC AG. 发明人 KASK PEET
分类号 C40B30/06;G01N21/64;C40B40/08;G01N15/00;G01N15/02;G01N33/483 主分类号 C40B30/06
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