发明名称 Semiconductor device that suppresses variations in high frequency characteristics of circuit elements
摘要 A semiconductor device includes a semiconductor substrate having a main surface, the main surface including a first and second areas formed with a high-frequency circuit element, and a third area located around the first and second areas and formed with a low-frequency circuit element. The semiconductor device also includes a sealing resin which covers the main surface; a plurality of first external terminals which are formed above the third area and which are electrically connected to the high-frequency circuit element, the first external terminals protruding from the surface of the sealing resin. The semiconductor device further includes a plurality of second external terminals which are formed above the third area and which are electrically connected to the low-frequency circuit element, the second external terminals protruding from the surface of the sealing resin.
申请公布号 US2007021089(A1) 申请公布日期 2007.01.25
申请号 US20060528335 申请日期 2006.09.28
申请人 TERUI MAKOTO;ANZAI NORITAKA;MORI HIROYUKI 发明人 TERUI MAKOTO;ANZAI NORITAKA;MORI HIROYUKI
分类号 H01L23/12;H04B1/26;H01L23/02;H01L23/04;H01L23/31;H01L23/48;H01L23/485;H01L23/52;H01L23/522;H01L23/66;H01L25/04;H01L25/18;H01L29/40 主分类号 H01L23/12
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