发明名称 |
Semiconductor device that suppresses variations in high frequency characteristics of circuit elements |
摘要 |
A semiconductor device includes a semiconductor substrate having a main surface, the main surface including a first and second areas formed with a high-frequency circuit element, and a third area located around the first and second areas and formed with a low-frequency circuit element. The semiconductor device also includes a sealing resin which covers the main surface; a plurality of first external terminals which are formed above the third area and which are electrically connected to the high-frequency circuit element, the first external terminals protruding from the surface of the sealing resin. The semiconductor device further includes a plurality of second external terminals which are formed above the third area and which are electrically connected to the low-frequency circuit element, the second external terminals protruding from the surface of the sealing resin.
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申请公布号 |
US2007021089(A1) |
申请公布日期 |
2007.01.25 |
申请号 |
US20060528335 |
申请日期 |
2006.09.28 |
申请人 |
TERUI MAKOTO;ANZAI NORITAKA;MORI HIROYUKI |
发明人 |
TERUI MAKOTO;ANZAI NORITAKA;MORI HIROYUKI |
分类号 |
H01L23/12;H04B1/26;H01L23/02;H01L23/04;H01L23/31;H01L23/48;H01L23/485;H01L23/52;H01L23/522;H01L23/66;H01L25/04;H01L25/18;H01L29/40 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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