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发明名称
Simplified quality indicator bit test procedures
摘要
申请公布号
AU2006200633(B2)
申请公布日期
2007.01.25
申请号
AU20060200633
申请日期
2006.02.16
申请人
QUALCOMM INCORPORATED
发明人
VINCE RYO BUTSUMYO;TAO CHEN;LEVENT AYDIN
分类号
H04B17/00
主分类号
H04B17/00
代理机构
代理人
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