发明名称 CLEANSING LIQUID COMPOSITION FOR SEMICONDUCTOR SUBSTRATE, METHOD OF MANUFACTURING THE CLEANING LIQUID COMPOSITION, CLEANSING METHOD OF SEMICONDUCTOR SUBSTRATE USING THE CLEANING LIQUID COMPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE COMPRISING THE CLEANSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide means for removing polymer on a semiconductor substrate and/or a conductive structure without damaging the conductive structure and effectively suppressing particle pollution and metal pollution. SOLUTION: A cleansing liquid composition for a semiconductor substrate comprises: 80 to 99.8999 mass% of water solution containing: ammonium hydroxide compound and fluorine containing compound; 0.1 to 5 mass% of buffer; and 0.0001 to 15 mass% of corrosion inhibitor. Also, disclosed are the method of manufacturing the cleansing liquid composition, the cleansing method of the semiconductor substrate using the cleansing liquid composition, and the method of manufacturing a semiconductor device comprising the cleansing method. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007019506(A) 申请公布日期 2007.01.25
申请号 JP20060184683 申请日期 2006.07.04
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KIM SE-YEON;JUN PIL-KWON;PARK JUNG-DAE;HAN MYOUNG-OK;KIM JEA-WOOK;CHAE SEUNG-KI;KIM KOOK-JOO;LEE JAE-SEOK;KO YONG-KYUN;LIM KWANG-SHIN;LEE YANG-KOO
分类号 H01L21/304;G03F7/42 主分类号 H01L21/304
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