发明名称 Semiconductor device with trench structure
摘要 A semiconductor device includes a common diffusion structure formed in each region of a substrate in which semiconductor components are formed. The diffusion structures are separated into sections by trenches to form semiconductor components. The trenches define sizes of the semiconductor components and isolate the semiconductor components from the surrounding area.
申请公布号 US2007018275(A1) 申请公布日期 2007.01.25
申请号 US20060528612 申请日期 2006.09.28
申请人 DENSO CORPORATION 发明人 HIMI HIROAKI;NAKANO TAKASHI;MIZUNO SHOJI
分类号 H01L29/00;H01L21/331;H01L21/76;H01L21/762;H01L21/82;H01L21/822;H01L21/8222;H01L21/8249;H01L21/84;H01L27/04;H01L27/06;H01L27/08;H01L27/12;H01L29/08;H01L29/73;H01L29/78;H01L29/786 主分类号 H01L29/00
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