发明名称 |
CMP COMPOSITION FOR POLISHING METAL |
摘要 |
A CMP composition for polishing metal layers is provided to exhibit fast polishing speed, low etching rate, and good temporal stability without using a dispersion stabilizer and an oxidizer stabilizer. The CMP composition for polishing a metal layer contains 0.001-1.0wt%, based on the total composition, of an iron complex represented by the following formula 1. In the formula 1, A is aminoalcohol. The aminoalcohol is selected from 2-dimethylamino-2-methyl-1-propanol, 2-diethylamino-1-ethanol, or 2-amino-2-methyl-1-propanol. The CMP composition is used to polish a tungsten layer or a copper layer in production process of semiconductors.
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申请公布号 |
KR20070012025(A) |
申请公布日期 |
2007.01.25 |
申请号 |
KR20050066803 |
申请日期 |
2005.07.22 |
申请人 |
TECHNO SEMICHEM CO., LTD. |
发明人 |
PARK, HYU BUM;KIM, SEOK JU;AHN, JUNG RYUL;PARK, JONG KWAN;BAEK, KUI JONG |
分类号 |
C09K3/14 |
主分类号 |
C09K3/14 |
代理机构 |
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地址 |
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