发明名称 CMP COMPOSITION FOR POLISHING METAL
摘要 A CMP composition for polishing metal layers is provided to exhibit fast polishing speed, low etching rate, and good temporal stability without using a dispersion stabilizer and an oxidizer stabilizer. The CMP composition for polishing a metal layer contains 0.001-1.0wt%, based on the total composition, of an iron complex represented by the following formula 1. In the formula 1, A is aminoalcohol. The aminoalcohol is selected from 2-dimethylamino-2-methyl-1-propanol, 2-diethylamino-1-ethanol, or 2-amino-2-methyl-1-propanol. The CMP composition is used to polish a tungsten layer or a copper layer in production process of semiconductors.
申请公布号 KR20070012025(A) 申请公布日期 2007.01.25
申请号 KR20050066803 申请日期 2005.07.22
申请人 TECHNO SEMICHEM CO., LTD. 发明人 PARK, HYU BUM;KIM, SEOK JU;AHN, JUNG RYUL;PARK, JONG KWAN;BAEK, KUI JONG
分类号 C09K3/14 主分类号 C09K3/14
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