发明名称 THERMAL ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To appropriately calibrate individual samples when thermal analysis is performed on a plurality of samples. SOLUTION: This thermal analysis apparatus comprises a TG measuring device 2, a mechanism for measuring the weight of a sample arranged at a sample measuring position 31b; a sample changer 3 for transferring samples between a turntable 52 on which a plurality of samples are arranged and the sample measuring position 31b; a weighing operation part for implementing a weight measuring function by the TG measuring device 2 on a sample arranged at the sample measuring position 31b as alternately transferring the plurality of sample to the sample measuring position 31b by the sample changer 3; and a calibration operation part for implementing the function of calibrating the TG measuring device 2 by adjusting the weighing operation part. The calibration operation part implements calibration processing prior to the measurement of at least one sample when the plurality of samples are to be sequentially measured by the weighing operation part. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007017370(A) 申请公布日期 2007.01.25
申请号 JP20050201342 申请日期 2005.07.11
申请人 RIGAKU CORP 发明人 TANAKA NORIHIRO;SUGIURA KASUMI;KANETANI TAKASHI
分类号 G01N5/04;G01N25/20 主分类号 G01N5/04
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