发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To form a uniform silicide layer without the abnormal growth of a nickel silicide in a semiconductor device formed with a nickel silicide layer. SOLUTION: A semiconductor device manufacturing method is provided with a process for forming a gate electrode on a silicone substrate, a process for forming side walls on both sides of the gate electrode, and a process for forming a silicide region on the silicon substrate. A reaction inhibition layer of silicification is formed in a surface region of the silicone substrate below the side walls before the formation process of the silicide region. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007019205(A) 申请公布日期 2007.01.25
申请号 JP20050198326 申请日期 2005.07.07
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOTANI AKIHIKO;ISHINAGA ATSUSHI;OKUNO YASUTOSHI;KANEGAE KENJI;SENGOKU NAOHISA
分类号 H01L21/336;H01L21/28;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088;H01L29/417;H01L29/78 主分类号 H01L21/336
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