发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To form a uniform silicide layer without the abnormal growth of a nickel silicide in a semiconductor device formed with a nickel silicide layer. SOLUTION: A semiconductor device manufacturing method is provided with a process for forming a gate electrode on a silicone substrate, a process for forming side walls on both sides of the gate electrode, and a process for forming a silicide region on the silicon substrate. A reaction inhibition layer of silicification is formed in a surface region of the silicone substrate below the side walls before the formation process of the silicide region. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007019205(A) |
申请公布日期 |
2007.01.25 |
申请号 |
JP20050198326 |
申请日期 |
2005.07.07 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KOTANI AKIHIKO;ISHINAGA ATSUSHI;OKUNO YASUTOSHI;KANEGAE KENJI;SENGOKU NAOHISA |
分类号 |
H01L21/336;H01L21/28;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/088;H01L29/417;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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