发明名称 Substrate processing method and substrate processing apparatus
摘要 The present invention provides a substrate processing method that can perform improved flattening and processing upon the formation of interconnects. The a substrate processing method includes a step of eliminating a level difference in a surface of a interconnect material to flatten a surface, a step of removing the interconnect material until the interconnect material present in the non-interconnect region of the substrate becomes a thin film or remains partly on a barrier material, a step of removing the interconnect material in the form of the thin film or remaining partly on the barrier material, a step of simultaneously removing the unnecessary interconnect material and the barrier material until the barrier material present in the non-interconnect region becomes a thin film or remains partly, and a step of removing the unnecessary interconnect material and the barrier material in the form of the thin film.
申请公布号 US2007020918(A1) 申请公布日期 2007.01.25
申请号 US20050553903 申请日期 2005.10.21
申请人 EBARA CORPORATION 发明人 HIROKAWA KAZUTO;TSUJIMURA MANABU
分类号 H01L21/3205;H01L21/4763;B23H5/08;C25F1/00;C25F3/14;H01L21/00;H01L21/304;H01L21/306;H01L21/311;H01L21/321;H01L21/768 主分类号 H01L21/3205
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