发明名称 Semiconductor device and semiconductor device manufacturing method
摘要 A semiconductor device includes a back gate electrode composed of a first single-crystal semiconductor layer formed on a first insulating layer, a second insulating layer formed on the first single-crystal semiconductor layer, a second single-crystal semiconductor layer formed on the second insulating layer and having a film thickness smaller than a film thickness of the first single-crystal semiconductor layer, a gate electrode formed on the second single-crystal semiconductor layer, and source and drain layers that are formed on the second single-crystal semiconductor layer and arranged on respective sides of the gate electrode.
申请公布号 US2007018246(A1) 申请公布日期 2007.01.25
申请号 US20060447926 申请日期 2006.06.07
申请人 TOKYO INSTITUTE OF TECHNOLOGY 发明人 KATO JURI;OKA HIDEAKI;KANEMOTO KEI;HARA TOSHIKI;SAKAI TETSUSHI
分类号 H01L27/12 主分类号 H01L27/12
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