发明名称 EVALUATING DEVICE, REPRODUCING DEVICE, AND EVALUATING METHOD
摘要 PROBLEM TO BE SOLVED: To more simply calculate a signal quality evaluation index correlated with a total error rate, even when two or more error patterns contribute to detected errors. SOLUTION: Metric difference MD values obtained for every two or more predetermined error patterns are compared with each other by using the individual threshold values obtained by dividing a Euclidean distance between a maximum-likelihood path and a 2nd path in each of the above error patterns by a common value, and the total number of the above metric difference values below the above threshold values is calculated as an evaluation value. Thus, from the very simple calculation of summing up the number of the metric difference values below the above threshold value, the signal quality evaluation index well correlated with the total error rate reflecting a contribution ratio of each pattern can be obtained. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007018622(A) 申请公布日期 2007.01.25
申请号 JP20050200235 申请日期 2005.07.08
申请人 SONY CORP 发明人 SHIRAISHI JUNYA
分类号 G11B20/18;G11B20/10 主分类号 G11B20/18
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