发明名称 Vertical transistor structures having vertical-surrounding-gates with self-aligned features
摘要 The present inventions include a vertical transistor formed by defining a channel length of the vertical-surrounding-gate field effect transistor with self-aligning features. The method provides process steps to define the transistor channel length and recess silicon pillars used to form the vertical-surrounding gate field effect transistor structure for use in the manufacture of semiconductor devices.
申请公布号 US2007020819(A1) 申请公布日期 2007.01.25
申请号 US20060495473 申请日期 2006.07.28
申请人 TANG SANH D;HUGLIN GRANT S 发明人 TANG SANH D.;HUGLIN GRANT S.
分类号 H01L21/332;H01L21/336;H01L21/337;H01L21/338;H01L21/8238;H01L21/84 主分类号 H01L21/332
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