| 摘要 |
A system and method for testing a link control card (LCC) includes a host, a middle plane (MP), and an array having a plurality of testing devices. The host is connected to the LCC for transmitting signals, and the host is connected to the array for sending out commands and receiving results. The MP is connected between the LCC and the testing device array. Each of the testing devices includes a micro-controller unit (MCU), a connector connected to the MCU for receiving the signals, a hub connected to the connector for testing the signals, a voltage margin control unit connected to the MCU for controlling a voltage margin of the LCC, an address setting unit connected to the MCU, and a first interface connected to the MCU for outputting results.
|
