发明名称 PHASE CHANGE MEMORY HAVING ADJUSTABLE RESISTANCE RATIO AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase change memory having adjustable resistance ratio. <P>SOLUTION: The phase change memory includes a phase change layer and a boundary layer formed so as to contact mutually, and at least two electrodes contacting the phase change layer and the boundary layer, respectively. One electrode of the two electrodes and the contact of the phase change layer and another electrode and the contact of the boundary layer are demarcated in their contact areas, respectively. The area demarcated by the contact between the electrode and the phase change layer is larger than the area demarcated by the contact between the electrode and the boundary layer. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007019449(A) 申请公布日期 2007.01.25
申请号 JP20050300268 申请日期 2005.10.14
申请人 IND TECHNOL RES INST 发明人 WANG WEN-HAN;RYO KYOMEI;YEH JYI-TYAN;CHIOU SHAN-HAW
分类号 H01L27/105;H01L45/00 主分类号 H01L27/105
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