| 摘要 |
A test system and a test method thereof are provided to cut down the cost by excluding an expensive test device and to reduce the test time by testing plural chips at the same time by using plural inspected reference chips. A test system includes a reference chip(100) for generating test data and an object chip(200) receiving and returning the test data to the reference chip. The reference chip judges an abnormal operation state of the object chip by comparing the test data with the returned test data, and comprises a test data generating unit(150) generating a test data and a comparing unit(160) comparing the test data and the returned test data.
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