发明名称 METHOD AND SYSTEM FOR IMAGING BUILDING MATERIAL AND BUILDING USING DIODE OSCILLATING ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an imaging system that is miniaturized and made light by using a diode oscillating element as an oscillating element, further achieves imaging in which capability for transmitting electromagnetic waves in a substance has been improved by selecting the wavelength of electromagnetic waves to be used, and can be utilized to detect structural defects and foreign matters in building materials and buildings. SOLUTION: For an imaging method and the imaging system that can be adapted to even large building materials and large buildings by reflection imaging using an oscillation frequency of 10-30 GHz (1 THz) by using a tunnel diode as an oscillating element, an oscillator unit is integrated with a detector unit, and a system for scanning integrated unit is adopted, thus enabling internal structural defects in wood, concrete walls, structures, and the inner wall of a tunnel, and the mixture of foreign matters to be observed easily. Additionally, by selecting an oscillation frequency, capability for transmitting electromagnetic waves in a substance is controlled, and the internal structure of buildings existing from the surface to a deep part can be imaged. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007017419(A) 申请公布日期 2007.01.25
申请号 JP20050228805 申请日期 2005.07.07
申请人 SEMICONDUCTOR RES FOUND 发明人 KURABAYASHI TORU;NISHIZAWA JUNICHI
分类号 G01N22/00;G01N22/02;G01N22/04 主分类号 G01N22/00
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