| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and a method of testing the same, wherein a test mode entry can easily and securely be performed without making circuits in the semiconductor device large in scale nor lowering the degree of integration without reference to whether the semiconductor device is a synchronous type or an asynchronous type. SOLUTION: The semiconductor device having a test mode for conducting a test is equipped with a first circuit that generates a first signal based upon a first dummy command signal inputted a plurality of times, and a second dummy command signal and a third dummy command signal different from the first dummy command signal and generates a second signal designating an entry into a corresponding test mode or an exit from the corresponding test mode based upon the first signal. COPYRIGHT: (C)2007,JPO&INPIT
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