| 摘要 |
A scan flip-flop circuit including an input section employing a dynamic circuit and an output section employing a static circuit, capable of latching in data within a period of a pulse width that is shorter than the clock cycle, wherein only three N-type transistors are connected in series in the input section employing a dynamic circuit. A data signal is input directly to one of the three N-type transistors. On the other hand, a test input signal is input to an AND/OR inverter circuit. The AND/OR inverter circuit receives, as a control signal, the potential of the node obtained as the clock signal passes through two inverter circuits. Therefore, there is required only a short hold time for the test input signal.
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