发明名称 |
SHALLOW TENCH ISOLATION PROCESS AND STRUCTURE |
摘要 |
A method of manufacturing an integrated circuit (IC) utilizes a shallow trench isolation (STI) technique. The shallow trench isolation technique is used in strained silicon (SMOS) process. The strained material (36) is formed after the trench (34) is formed. The process can be utilized on a compound semiconductor layer (15) above a buried oxide (Box) layer (14). ® KIPO & WIPO 2007
|
申请公布号 |
KR20070011262(A) |
申请公布日期 |
2007.01.24 |
申请号 |
KR20067014049 |
申请日期 |
2004.12.21 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
XIANG QI;PAN JAMES N.;GOO, JUNG SUK |
分类号 |
H01L21/762;H01L21/336;H01L29/10;H01L29/45;H01L29/786 |
主分类号 |
H01L21/762 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|