DEFECT LOCATION IDENTIFICATION FOR MICRODEVICE MANUFACTURING AND TEST,申请号EP20050746564-传众专利搜索

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发明名称	DEFECT LOCATION IDENTIFICATION FOR MICRODEVICE MANUFACTURING AND TEST
摘要
申请公布号	EP1745373(A2)	申请公布日期	2007.01.24
申请号	EP20050746564	申请日期	2005.05.09
申请人	MENTOR GRAPHICS CORPORATION	发明人	SAWICKI, JOSEPH, D.;FERGUSON, JOHN, G.;DHAR, SANJAY;ROBLES, JUAN, ANDRES, TORRES;RAJSKI, JANUSZ, E.
分类号	G06F17/50;G01R31/3183;G06F9/455	主分类号	G06F17/50
代理机构		代理人
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