发明名称 TEST CIRCUIT FOR WHITE LIGHT EMITTING DIODE AND TESTING METHOD USING THE SAME
摘要 A test circuit of a white light emitting diode and a test method using the same are provided to test a defect of the white light emitting diode by supplying various test currents to the white light emitting diode in checking the drop rate of voltage supplied from a voltage stabilizer to the white light emitting diode. A test circuit of a white light emitting diode(205) includes a voltage stabilizer(202) for outputting the voltage required for the emission of the white light emitting diode; a voltage drop checking unit(203) selectively supplying various kinds of test currents for checking the voltage drop of the white light emitting diode, to the white light emitting diode; and a driving control unit(204) selectively controlling the emission of the white light emitting diode by receiving the voltage output from the voltage stabilizer and controlling the test current output from the voltage drop checking unit.
申请公布号 KR20070010571(A) 申请公布日期 2007.01.24
申请号 KR20050065291 申请日期 2005.07.19
申请人 PANTECH CO., LTD. 发明人 LEE, JOUN HEE
分类号 G01R31/00 主分类号 G01R31/00
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