| 发明名称 |
Apparatus for measuring wavefront aberrations |
| 摘要 |
<p>An apparatus and method for measuring wavefront aberrations. The apparatus comprises a reflecting device (128) for reflecting selected portions of the wavefront (126), an imaging device (132) for capturing information related to the selected portions, and a processor (136) for calculating aberrations of the wavefront from the captured information. The method comprises reflecting selected portions of a wavefront (126) onto the imaging device (132), capturing information related to the selected portions, and processing the captured information to derive the aberrations.</p> |
| 申请公布号 |
EP1745738(A2) |
申请公布日期 |
2007.01.24 |
| 申请号 |
EP20060076671 |
申请日期 |
2001.09.21 |
| 申请人 |
JOHNSON AND JOHNSON VISION CARE, INC. |
发明人 |
DAVIS, BRETT A.;COLLINS, MICHAEL J.;ISKANDER, DAOUD R.;ROFFMAN, JEFFREY H.;ROSS III, DENWOOD F. |
| 分类号 |
A61B3/103;G01M11/02;A61B3/10;G01J9/00 |
主分类号 |
A61B3/103 |
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