发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor device is provided to prevent the characteristic of a ferroelectric capacitor from being deteriorated by reducing the quantity of water, hydrogen and gas increased when sealing resin is hardened. A plurality of semiconductor devices are arranged to form a semiconductor chip(111) having a memory cell, including a ferroelectric capacitor structure formed by interposing a ferroelectric layer having a ferroelectric characteristic by two electrodes. The semiconductor chip is sealed by using sealing resin(115) having a filler content of 90 weight percent so as to form a thin film package structure whose mounting height is not greater than 1.27 millimeters. The filler can be a spherical filler.
申请公布号 KR20070011071(A) 申请公布日期 2007.01.24
申请号 KR20060016027 申请日期 2006.02.20
申请人 FUJITSU LIMITED 发明人 SAIGOH KAORU;NAGAI KOUICHI
分类号 H01L21/56 主分类号 H01L21/56
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