发明名称 Sampling frequency offset estimation apparatus and method for OFDM system
摘要 <p>A sampling frequency offset estimation apparatus and method to be applied to an OFDM (orthogonal frequency division multiplexing) system are provided. The apparatus includes an ADC (analog-to-digital converter 100) sampling a received signal based on a predetermined sampling frequency; an FFT (Fast Fourier Transform) unit (300) transforming the sampled received signal into a frequency domain; a phase calculator (610) calculating phase shifts of pilot subcarriers of the sampled received signal which has been transformed into the frequency domain; a determiner (620) calculating phase shift reaching times at which samples of the pilot subcarriers shift due to the phase shift; a time offset calculator (630) calculating a sampling time offset using the pilot subcarriers, and a frequency offset calculator (630) calculating a sampling frequency offset based on the phase shift reaching times and the sampling time offset.</p>
申请公布号 EP1746793(A2) 申请公布日期 2007.01.24
申请号 EP20060012412 申请日期 2006.06.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YUN-YOUNG;ROH, JAE-HO
分类号 H04L27/26 主分类号 H04L27/26
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