发明名称 |
Sampling frequency offset estimation apparatus and method for OFDM system |
摘要 |
<p>A sampling frequency offset estimation apparatus and method to be applied to an OFDM (orthogonal frequency division multiplexing) system are provided. The apparatus includes an ADC (analog-to-digital converter 100) sampling a received signal based on a predetermined sampling frequency; an FFT (Fast Fourier Transform) unit (300) transforming the sampled received signal into a frequency domain; a phase calculator (610) calculating phase shifts of pilot subcarriers of the sampled received signal which has been transformed into the frequency domain; a determiner (620) calculating phase shift reaching times at which samples of the pilot subcarriers shift due to the phase shift; a time offset calculator (630) calculating a sampling time offset using the pilot subcarriers, and a frequency offset calculator (630) calculating a sampling frequency offset based on the phase shift reaching times and the sampling time offset.</p> |
申请公布号 |
EP1746793(A2) |
申请公布日期 |
2007.01.24 |
申请号 |
EP20060012412 |
申请日期 |
2006.06.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YUN-YOUNG;ROH, JAE-HO |
分类号 |
H04L27/26 |
主分类号 |
H04L27/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|