| 摘要 |
<p>The invention relates to a method for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, said method comprising the steps of:
a) preprocessing the measured reflection data into a plurality of partial or full stacks;
b) specifying one or more initial subsurface parameters defining an initial subsurface model;
c) specifying a wavelet or wavelet field for each of the partial or full stacks of the preprocessed measured reflection data;
d) calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
e) optimizing an objective function, comprising the weighted difference between preprocessed measured reflection data and synthetic reflection data, for a plurality of trace positions simultaneously;
f) outputting the optimized one or more subsurface parameters.</p> |
