发明名称 MOSFET with electrostatic discharge protection structure and method of fabrication
摘要 A semiconductor circuit comprises a semiconductor substrate, a semiconductor device having a drain region disposed in the substrate, and a reverse doped region laterally adjacent and laterally contacting the drain region wherein the reverse doped region has an opposite doping type from that of the drain region and a dopant concentration higher than that of the semiconductor substrate, the reverse doped region and the drain forming a p-n junction.
申请公布号 US7166876(B2) 申请公布日期 2007.01.23
申请号 US20040833773 申请日期 2004.04.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG SHAO-CHANG
分类号 H01L23/58;H01L21/8234;H01L23/60;H01L27/02;H01L27/088;H01L27/12;H01L29/786;H01L29/94 主分类号 H01L23/58
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