发明名称 |
MOSFET with electrostatic discharge protection structure and method of fabrication |
摘要 |
A semiconductor circuit comprises a semiconductor substrate, a semiconductor device having a drain region disposed in the substrate, and a reverse doped region laterally adjacent and laterally contacting the drain region wherein the reverse doped region has an opposite doping type from that of the drain region and a dopant concentration higher than that of the semiconductor substrate, the reverse doped region and the drain forming a p-n junction.
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申请公布号 |
US7166876(B2) |
申请公布日期 |
2007.01.23 |
申请号 |
US20040833773 |
申请日期 |
2004.04.28 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
HUANG SHAO-CHANG |
分类号 |
H01L23/58;H01L21/8234;H01L23/60;H01L27/02;H01L27/088;H01L27/12;H01L29/786;H01L29/94 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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