| 摘要 |
A probe block and a probe card are provided to enhance productivity by forming an integrated structure of vertical needles and insulators by attaching the vertical needles to the insulators. Each of needles(20) includes a substrate probing part(21) formed at an upper end thereof and a wafer probing part(22) formed at a lower end thereof. The substrate probing part is in contact with a substrate electrode pad of a printed circuit board. The wafer probing part is in contact with an electrode pad of a wafer. A plurality of insulators(30) are arranged between the needles in order to maintain an insulating state between the needles. A needle fixing plate(40) is used for fixing the needles and the insulators.
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