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发明名称
Apparatus for generating measurement signal for measuring self refresh period for semiconductor memory device
摘要
申请公布号
KR100672136(B1)
申请公布日期
2007.01.19
申请号
KR20050041721
申请日期
2005.05.18
申请人
发明人
分类号
G11C11/4076;G11C11/401;G11C11/406
主分类号
G11C11/4076
代理机构
代理人
主权项
地址
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