发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device wherein variations in the timing of supply of power and the interruption of power and variations in a supplied voltage to each of function circuits are suppressed and power consumption caused by a leak current of each function circuit is reduced. SOLUTION: The semiconductor integrated circuit device includes a function circuit block 1, a power supply 3 for supplying power to the function circuit block 1, a power interruption circuit 4 provided between the function circuit block 1 and the power supply 3 and comprising a plurality of switch elements 31, and a power interruption control circuit 5 for independently driving each switch element 31. The function circuit block 1 is formed by integrating the function circuits such as a logic circuit and a memory circuit. Each function circuit is provided with a power terminal 21, each power terminal 21 and each switch element 31 are electrically connected by a power wire 22, and lengths of the power wires 22 are equal to each other. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007013036(A) 申请公布日期 2007.01.18
申请号 JP20050194879 申请日期 2005.07.04
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAJIKA KENICHI
分类号 H01L21/822;H01L25/07;H01L25/18;H01L27/04;H01L27/10 主分类号 H01L21/822
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