发明名称 LITHOGRAPHY EQUIPMENT, RADIATION SYSTEM, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide lithography equipment including a contamination-resistant barrier or a wheel trap, which suppresses charged particles in the form of plasma moving with a radiating beam, and ions moving in front of or at the back of such plasma. <P>SOLUTION: The wheel trap is arranged in a path of the radiant beam. The wheel trap includes an array of conductive strips 34. A voltage-applying circuit is connected to the strips 34 to apply a voltage difference between adjoining strip couples of the strips 34. The voltage-applying circuit includes a current-limiting circuit constituted so that the current to the strips 34 is limited to a value lower than the threshold, at which self-sustained arc discharge is be caused in the wheel trap. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007013167(A) 申请公布日期 2007.01.18
申请号 JP20060178866 申请日期 2006.06.29
申请人 ASML NETHERLANDS BV 发明人 GAYAZOV ROBERT R;BANINE VADIM YEVGENYEVICH;IVANOV VLADIMIR V;KOROB EVGENII D;KOSHELEV KONSTANTIN N;ZUKAVISHVILI GIVI GEORGIEVITCH;SIDELNIKOV YURII V
分类号 H01L21/027 主分类号 H01L21/027
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