发明名称 POTENTIAL DIFFERENCE MEASURING TERMINAL SUBSTRATE AND NON-DESTRUCTIVE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a potential difference measuring terminal substrate for non-destructive inspection using a potential difference method, and a non-destructive inspection method of a flaw using it. SOLUTION: A plurality of potential difference measuring terminals, which are separated at a predetermined interval and preferably arranged in a matrix form, a plurality of external wiring attaching terminals and a plurality of conductive wirings, which connect the external wiring attaching terminals and the potential difference measuring terminals in a 1:1 ratio are arranged on the surface of an insulating film-like substrate by printing. The potential difference measuring terminals are provided to a measuring target in a conductively bondable manner and the external wiring attaching terminals are further provided to external wiring in an attachable manner and covered with an insulating material to obtain the potential difference measuring terminal substrate wherein an adhesive layer is provided on the side of the measuring target. The joint of the measuring target and the potential difference measuring terminal is performed using a conductive adhesive. By this constitution, the setting of the potential difference measuring terminal of non-destructive inspection using the potential difference method can be performed rapidly and precisely without exerting an effect on the measuring target. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007010385(A) 申请公布日期 2007.01.18
申请号 JP20050189099 申请日期 2005.06.29
申请人 ATLUS:KK 发明人 ARITA KEISUKE;UCHIYAMA TOMINARI
分类号 G01N27/20 主分类号 G01N27/20
代理机构 代理人
主权项
地址