Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same

摘要

A fault on a measuring point and information about a driving circuit of the fault are extracted. A signal value of the portion related to the fault on the measuring point and an input value of the driving circuit of the portion are obtained in case that a fault is not included. A fault candidate is extracted from detected faults based on a difference between a measured IDDQ value on a failed measuring point and a measured estimated IDDQ value in case that the fault is not included. An estimated calculation value to be a difference of an IDDQ value is calculated in case that each of the faults is included with respect to the case that the fault on the failed measuring point is not included. The estimated calculation value to be the difference is compared with a difference between the measured value on the failed measuring point and the measured estimation value so as to decide whether the fault candidate is the fault corresponding to a defective portion or not.