发明名称 |
SEMICONDUCTOR DEVICE AND ITS FABRICATION PROCESS |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device advantageous for scaling-down, and to provide its fabrication process. SOLUTION: The semiconductor device comprises a gate insulating film 12 equipped at least with a first insulating film 21 provided in the major surface of a semiconductor device, and a first high dielectric film 22-1 principally comprising a compound of the constitutive element of the first insulating film and a predetermined metal element provided on the first insulating film and having a dielectric constant higher than that of the first insulating film, a gate electrode 13 of Cu or principally comprising Cu provided on the gate insulating film 12, and a source or a drain 15 provided in the semiconductor substrate while being isolated so that the gate electrode is inserted. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007012922(A) |
申请公布日期 |
2007.01.18 |
申请号 |
JP20050192652 |
申请日期 |
2005.06.30 |
申请人 |
TOSHIBA CORP;TOSHIBA MICROELECTRONICS CORP |
发明人 |
NASU ISATO;SHIBATA HIDEKI;USUI TAKAMASA |
分类号 |
H01L29/78;H01L21/28;H01L21/316;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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