| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device wherein a circuit node having any fault can easily be specified during testing even if shortcircuiting occurs in wiring. SOLUTION: The semiconductor device is provided with a blocks 1-3 wherein sequential test input patterns are used to conduct logic verification, a signal wiring pattern to transmit signals which are used in the blocks 1-3 during the logic verification, and fixed potential wiring patterns 11a-11d which are formed surrounding the signal wiring pattern and are electrically connected to Vss. COPYRIGHT: (C)2007,JPO&INPIT
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