| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe carrier manufacturing apparatus, capable of efficiently judging the concentration of a probe in the spot formed on a carrier using simple operations, when a probe carrier, which is constituted by fixing different probes on the carrier, is manufactured, and to provide a probe carrier manufacturing method. SOLUTION: The condition of the liquid droplet spot formed on the carrier is measured to be compared with known data to conveniently determine the condition of the probe, such as presence of the probe in liquid droplet spot or its concentration. COPYRIGHT: (C)2007,JPO&INPIT |
