ELECTRONIC COMPONENT TEST DEVICE

摘要

When the number of electronic components under test placed on a loader buffer unit (114) to be held in the next text by contact arms (117, 118) is less than N, among the N electronic components under test held for execution of the current test, an electronic component under test at the position of the contact arms corresponding to the position lacking in the loader buffer unit is held as it is. While holding the electronic components under test, the electronic components under test placed on the loader buffer unit for execution of the next text are held. A test is executed in this state.