发明名称 Duplicated double checking production rule set for fault-tolerant electronics
摘要 Systems and methods for mitigating the effects of soft errors in asynchronous digital circuits. Circuits are constructed using stages comprising doubled logic elements which are connected to c-elements that compare the output states of the double logic elements. The inputs of logic elements in a stage are inhibited from changing until the outputs of the c-elements of that stage are enabled. The c-elements inhibit the propagation of a soft error by halting the operation of the circuit until the temporary effects of the soft error pass.
申请公布号 US2007016823(A1) 申请公布日期 2007.01.18
申请号 US20060375390 申请日期 2006.03.14
申请人 CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 JANG WONJIN;MARTIN ALAIN J.;NYSTROEM MIKA;DAMA JONATHAN A.
分类号 G06F11/00 主分类号 G06F11/00
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