发明名称 |
Duplicated double checking production rule set for fault-tolerant electronics |
摘要 |
Systems and methods for mitigating the effects of soft errors in asynchronous digital circuits. Circuits are constructed using stages comprising doubled logic elements which are connected to c-elements that compare the output states of the double logic elements. The inputs of logic elements in a stage are inhibited from changing until the outputs of the c-elements of that stage are enabled. The c-elements inhibit the propagation of a soft error by halting the operation of the circuit until the temporary effects of the soft error pass.
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申请公布号 |
US2007016823(A1) |
申请公布日期 |
2007.01.18 |
申请号 |
US20060375390 |
申请日期 |
2006.03.14 |
申请人 |
CALIFORNIA INSTITUTE OF TECHNOLOGY |
发明人 |
JANG WONJIN;MARTIN ALAIN J.;NYSTROEM MIKA;DAMA JONATHAN A. |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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主权项 |
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地址 |
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