A method and apparatus for data analysis according to various aspects of the present invention is configured to identify statistical outliers in test data for components, including local outliers representing outliers within subsets of larger data populations.
申请公布号
WO2006023744(A3)
申请公布日期
2007.01.18
申请号
WO2005US29585
申请日期
2005.08.19
申请人
TEST ADVANTAGE, INC.;MIGUELANEZ, EMILIO;GORIN, JACKY;TABOR, ERIC, PAUL
