TECHNIQUE FOR REDUCING SILICIDE NON-UNIFORMITIES BY ADAPTING AVERTICAL DOPANT PROFILE
摘要
By modifying the vertical dopant concentration in deep drain and source regions, the reaction behavior during the formation of metal suicide regions 217 may be controlled. For this purpose, an increased dopant concentration is formed around a target depth (X<SUB>s</SUB>) for the metal suicide interface, thereby reducing the reaction speeds and thus improving the uniformity of the resulting metal suicide interface.
申请公布号
WO2006130375(A3)
申请公布日期
2007.01.18
申请号
WO2006US19722
申请日期
2006.05.23
申请人
ADVANCED MICRO DEVICES, INC.;WIRBELEIT, FRANK;BROWN, DAVID;PRESS, PATRICK