发明名称 TECHNIQUE FOR REDUCING SILICIDE NON-UNIFORMITIES BY ADAPTING AVERTICAL DOPANT PROFILE
摘要 By modifying the vertical dopant concentration in deep drain and source regions, the reaction behavior during the formation of metal suicide regions 217 may be controlled. For this purpose, an increased dopant concentration is formed around a target depth (X<SUB>s</SUB>) for the metal suicide interface, thereby reducing the reaction speeds and thus improving the uniformity of the resulting metal suicide interface.
申请公布号 WO2006130375(A3) 申请公布日期 2007.01.18
申请号 WO2006US19722 申请日期 2006.05.23
申请人 ADVANCED MICRO DEVICES, INC.;WIRBELEIT, FRANK;BROWN, DAVID;PRESS, PATRICK 发明人 WIRBELEIT, FRANK;BROWN, DAVID;PRESS, PATRICK
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址