摘要 |
The invention concerns a method and a device for determining the reliability of a microsystem comprising a plurality of functional components. It consists in providing a virtual functional prototype (1) representing the different functional components of the microsystem, associating with said virtual functional prototype (1), at least one module, called aging module (4), for modeling the aging laws of the different functional components of the microsystem. The virtual functional component (1) and/or the aging module (4) being adapted to be able to receive and process digital data (7) representing predetermined conditions of use and/or of environment of the microsystem, applying the aging module (4) to the virtual functional prototype (1) so as to provide a virtual prototype of reliability (2) capable of determining from the evolution of the functional behaviour of the microsystem in time of the digital data representing predetermined conditions of use and/or of environment of the microsystem. |
申请人 |
CENTRE NATIONAL D'ETUDES SPATIALES (C.N.E.S.);SCHMITT, PETRA;PRESSECQ, FRANCIS;ESTEVE, DANIEL;FOURNIOLS, JEAN-YVES |
发明人 |
SCHMITT, PETRA;PRESSECQ, FRANCIS;ESTEVE, DANIEL;FOURNIOLS, JEAN-YVES |