发明名称 NAND FLASH MEMORY ELEMENT AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an NAND flash memory element and its manufacturing method for improving disturb characteristics. SOLUTION: This method for manufacturing an NAND flash memory element includes a step for providing a semiconductor substrate where a drain select transistor DSL, a source select transistor SSL, and memory cell transistors connected in series between them are formed; and a step for forming an oxide film in the surface of the semiconductor substrate at both sides of the gate of the source select transistor. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007013078(A) 申请公布日期 2007.01.18
申请号 JP20050368369 申请日期 2005.12.21
申请人 HYNIX SEMICONDUCTOR INC 发明人 PARK HEE SIK;PARK SEONG JO
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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