发明名称 Method of making a semiconductor device using a dual-tone phase shift mask
摘要 A method for making a semiconductor device is provided which comprises (a) providing a source of actinic radiation ( 601 ), (b) providing a reticle comprising (i) a substrate having a plurality of structures defined therein, said substrate being essentially transparent to the actinic radiation, and (ii) a layer of attenuating material disposed over at least some of said plurality of structures, wherein the layer of attenuating material has a transmission with respect to the actinic radiation that is within the range of about 5% to about 50%, and wherein the combination of the layer of attenuating material and the substrate imparts to the actinic radiation a phase change within the range of about 165° to about 225° ( 603 ), and (c) utilizing the reticle and the source of actinic radiation to impart a pattern to a semiconductor substrate ( 607, 609 ).
申请公布号 US2007015089(A1) 申请公布日期 2007.01.18
申请号 US20050181168 申请日期 2005.07.14
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 PETERS RICHARD D.;ROMAN BERNARD J.;WASSON JAMES R.
分类号 G03F7/26 主分类号 G03F7/26
代理机构 代理人
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